Fast and Reliable Probabilistic Reflectometry Inversion with Prior-Amortized Neural Posterior Estimationphysics.app-ph
New method finds all thin film structures from reflectometry data.
problem Computational prohibitive for standard algorithms, leading to unreliable analysis.
method Prior-Amortized Neural Posterior Estimation (PANPE) combining simulation-based inference and adaptive priors.
result Identifies all realistic structures in seconds, setting new standards in reflectometry.