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10 results for IIoT

FDA3 defends IIoT applications against adversarial attacks by federating defense knowledge.

problem Adversarial attacks on DNNs in IIoT applications can cause devastating consequences.
method Federated learning approach to aggregate defense knowledge from different sources.
result FDA3 can resist more attacks than existing methods and prevent new attacks.

The paper proposes an AI and IIoT framework for improved maintenance.

problem Current maintenance practices need improvement with AI and IIoT.
method Review of reliability modeling, introduction of Intelligent Maintenance framework, and novel probabilistic deep learning approach.
result Demonstrated novel probabilistic deep learning reliability modelling in Turbofan Engine Degradation Dataset.

New AI method improves anomaly detection across different IIoT sensors.

problem Poor performance of anomaly detection models when applied to different machines.
method Robust AI method using pre-processing and multiple models on different pumps.
result Models perform well across different environments and types of pumps.

Paper proposes a multi-phase pruning pipeline for deep ensemble learning on IIoT devices.

problem Computational limitations of IoT devices for deep learning models.
method Generates diverse pruned models, applies integer quantization, and uses clustering-based pruning.
result Significant reduction in model size (up to 90%) and improved performance (up to 7%) on IIoT devices.

This paper proposes a multi-head attention model for predicting RUL in IIoT environments.

problem Estimating RUL for complex industrial equipment using IIoT data.
method Multi-Head Attention Mechanism combined with LSTM for multi-dimensional time-series data.
result The proposed model outperforms state-of-the-art models on benchmark datasets.

This paper proposes a communication-efficient deep anomaly detection framework for industrial IoT.

problem Accurately detecting anomalies in time-series data from edge devices in industrial IoT.
method A federated learning-based approach with an Attention Mechanism-based Convolutional Neural Network-Long Short Term Memory (AMCNN-LSTM) model and gradient compression.
result The proposed framework accurately and timely detects anomalies with reduced communication overhead.

This paper proposes AI-based solutions for optimizing semiconductor manufacturing processes.

problem Optimizing semiconductor manufacturing processes with advanced analytics.
method Evolutionary Computing and Deep Learning algorithms for feature selection and neural networks.
result Advanced algorithm for intelligent feature selection in semiconductor manufacturing.

As the Industrial Internet of Things (IIoT) grows, systems are increasingly being monitored by arrays of sensors returning time-series data at ever-increasing 'volume, velocity and variety' (i.e. Industrial Big Data). An obvious use for these data is real-time systems condition monitoring and prognostic time to failure…

2018-04-09abs ↗pdf ↗