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On-device research index

arXiv research

A locally-built, LLM-digested index of recent arXiv papers in quant finance, geometry/topology, and statistical ML — keyword search served straight from SQLite on this machine.

168,742 papers · 148 categories

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1 result for “Electromigration”
EM-GAN: Fast Stress Analysis for Multi-Segment Interconnect Using Generative Adversarial Networkscs.LG

EM-GAN uses GANs for fast stress analysis of multi-segment interconnects.

problem Fast and accurate stress analysis for EM failure assessment in multi-segment interconnects.
method Conditional GAN model trained on images of multi-segment wires and current densities.
result EM-GAN provides accurate stress distribution with 6.6% error and 8.3X speedup.
EM-GANGenerative Adversarial NetworksElectromigrationStress AnalysisMulti-segment Interconnects
2020-04-27abs ↗pdf ↗